IEC 61580-9:1996
Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

Standard No.

IEC 61580-9:1996

Release Date

1996

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 61580-9:1996

Replace

IEC 46B/210/FDIS:1996

Scope

This part of IEC 1580 gives the means for determining the reflection coefficient at the junction of two similar rectangular waveguides due to the following imperfections: a) differences in the waveguide internal dimensions; b) lateral displacement between the waveguide axes in either the H or E plane; c) angular misalignment between the waveguide axes.

IEC 61580-9:1996 history

• 1996 IEC 61580-9:1996 Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces