IEC 60068-2-20/AMD2:1987
Environmental testing. Part 2: Tests. Test T: Soldering

Standard No.

IEC 60068-2-20/AMD2:1987

Release Date

1987

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2008-07

Replace By

IEC 60068-2-20:2008

Latest

IEC 60068-2-20:2021 RLV

Replace

IEC 60068-2-20 AMD 1:1986

Scope

Includes the text of amendments 1 and 2. The text of amendment 2 can be distinguished by a vertical line in the margine. Inserts a new paragraph before the last paragraph in sub-clause 4.7.3 on page 19. Adds a new item m) to sub-clause 4.11 on page 25 an

IEC 60068-2-20/AMD2:1987 history

• 0000 IEC 60068-2-20:2021 RLV
• 2008 IEC 60068-2-20:2008 Environmental testing - Part 2: Tests - Test T: Test methods for soldeability and resistance to soldering heat of devices with leads
• 1970 IEC 60068-2-20:1979/AMD2:1987 Amendment 2 - Basic environmental testing procedures - Part 2-20: Tests - Test T: Soldering
• 1970 IEC 60068-2-20:1979/AMD1:1986 Amendment 1 - Basic environmental testing procedures - Part 2: Tests - Test T: Soldering
• 1979 IEC 60068-2-20:1979 Environmental testing. Part 2: Tests. Test T: Soldering
• 1970 IEC 60068-2-20:1968 Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test T: Soldering
• 1970 IEC 60068-2-20:1960 Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test T: Soldering