IEC 60748-11-1:1992
Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits

Standard No.

IEC 60748-11-1:1992

Release Date

1992

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 60748-11-1:1992

Scope

Purpose of the tests is to check the internal materials, construction and workmanship for compliance with the requirements of the applicable specification. The tests will normally be used prior to capping or encapsulation on a 100 % inspection basis to d

IEC 60748-11-1:1992 history

• 1992 IEC 60748-11-1:1992 Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits