DIN 50443-1:1988
Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography
- Standard No.
- DIN 50443-1:1988
- Release Date
- 1988
- Published By
- German Institute for Standardization
- Status
- Latest
- DIN 50443-1:1988
- Scope
- This standard determines the methods for the recognition of defects and inhomogeneities in semiconductor silicon single crystals by x-ray topography.
DIN 50443-1:1988 history
- 1988 DIN 50443-1:1988 Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography
