DIN 50435:1988
Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method

Standard No.
DIN 50435:1988
Release Date
1988
Published By
German Institute for Standardization
Status
Latest
DIN 50435:1988

DIN 50435:1988 history

  • 1988 DIN 50435:1988 Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method
Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method



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