T/IAWBS 007-2018
Test method for thickness of 4H silicon carbide homo-epitaxial layers by infrared reflectance (English Version)

Standard No.

T/IAWBS 007-2018

Language

Chinese, Available in English version

Release Date

2018

Published By

Group Standards of the People's Republic of China

Latest

T/IAWBS 007-2018

T/IAWBS 007-2018 history

• 2018 T/IAWBS 007-2018 Test method for thickness of 4H silicon carbide homo-epitaxial layers by infrared reflectance