IEEE 300-1969
USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)

Standard No.

IEEE 300-1969

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Status

Be replaced

Replace By

IEEE 300-1982

Latest

IEEE 300-1988

IEEE 300-1969 history

• 1988 IEEE 300-1988 Standard Test Procedures for Semiconductor Charged-Particle Detectors
• 1982 IEEE 300-1982 STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS
• 1970 IEEE 300-1969 USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)