GB/T 42905-2023
Infrared reflection method for measuring the thickness of silicon carbide epitaxial layer (English Version)
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GB/T 42905-2023
Standard No.
GB/T 42905-2023
Language
Chinese,
Available in English version
Release Date
2023
Published By
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
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GB/T 42905-2023
GB/T 42905-2023 history
2023
GB/T 42905-2023
Infrared reflection method for measuring the thickness of silicon carbide epitaxial layer
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