KS C IEC 60749-16-2006(2016)
Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)

Standard No.

KS C IEC 60749-16-2006(2016)

Release Date

2006

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60749-16-2006(2021)

Latest

KS C IEC 60749-16-2006(2021)

KS C IEC 60749-16-2006(2016) history

• 0000 KS C IEC 60749-16-2006(2021)
• 0000 KS C IEC 60749-16-2006(2016)
• 2006 KS C IEC 60749-16:2006 Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)