T/CIE 070-2020
Evaluation of Industrial High-Reliability Integrated Circuits Part 4: Non-Volatile Memories (English Version)
- Standard No.
- T/CIE 070-2020
- Language
- Chinese, Available in English version
- Release Date
- 2020
- Published By
- Group Standards of the People's Republic of China
- Latest
- T/CIE 070-2020
- Scope
- This document specifies the testing requirements, testing methods and inspection rules for flash memory chips (hereinafter referred to as chips) in industrial-grade high-reliability non-volatile memories. It does not involve ROM for the time being. This document is applicable to the identification, acceptance, evaluation and testing activities of industrial-grade high-reliability flash memory chips and embedded non-volatile memory chips.
T/CIE 070-2020 history
- 2020 T/CIE 070-2020 Evaluation of Industrial High-Reliability Integrated Circuits Part 4: Non-Volatile Memories
