YS/T 1164-2016
Determination of impurity content in high-purity quartz products for silicon materials by inductively coupled plasma optical emission spectrometry (English Version)
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YS/T 1164-2016
Standard No.
YS/T 1164-2016
Language
Chinese,
Available in English version
Release Date
2016
Published By
工业和信息化部
Latest
YS/T 1164-2016
YS/T 1164-2016 history
2016
YS/T 1164-2016
Determination of impurity content in high-purity quartz products for silicon materials by inductively coupled plasma optical emission spectrometry
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