DIN EN IEC 60749-10:2023-06
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022 / Note: Date of issue 2023-05-19*Intended as replacement for DIN EN 60749-10 (200...

Standard No.

DIN EN IEC 60749-10:2023-06

Release Date

2023

Published By

German Institute for Standardization

Status

Be replaced

Replace By

DIN EN IEC 60749-10:2023-12

Latest

DIN EN IEC 60749-10:2023-12

DIN EN IEC 60749-10:2023-06 history

• 2023 DIN EN IEC 60749-10:2023-12 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022 / Note: DIN EN 60749-10 (2003-04) remains valid alongside this standard until 202...
• 2023 DIN EN IEC 60749-10:2023-06 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022 / Note: Date of issue 2023-05-19*Intended as replacement for DIN EN 60749-10 (200...