KS D 0261-2012(2017)
Visual inspection for silicon wafers with specular surfaces

Standard No.

KS D 0261-2012(2017)

Release Date

2012

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS D 0261-2012(2022)

Latest

KS D 0261-2012(2022)

KS D 0261-2012(2017) history

• 0000 KS D 0261-2012(2022)
• 0000 KS D 0261-2012(2017)
• 2012 KS D 0261-2012 Visual inspection for silicon wafers with specular surfaces
• 0000 KS D 0261-2002