UNE-EN 60749-37:2008 Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)
2008UNE-EN 60749-37:2008 Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)