IEEE No 300-1969*USAS N42.1-1969
USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)

Standard No.

IEEE No 300-1969*USAS N42.1-1969

Release Date

1968

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Status

Be replaced

Replace By

IEEE 300-1982

Latest

IEEE 300-1988

Scope

Semiconductor radiation detectors have come into widespread use in recent years for detection and high-resolution spectroscopy of ionizing radiation. Both silicon and germanium detectors have been developed, with silicon finding its principal application in the detection and analysis of heavy charged particles. Germanium detectors with their relatively high atomic number (as compared with silicon)...

IEEE No 300-1969*USAS N42.1-1969 history

• 1988 IEEE 300-1988 Standard Test Procedures for Semiconductor Charged-Particle Detectors
• 1982 IEEE 300-1982 STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS
• 1968 IEEE No 300-1969*USAS N42.1-1969 USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)