IEC 62860:2013*IEEE Std 1620:2008
IEC/IEEE Test methods for the characterization of organic transistors and materials

Standard No.
IEC 62860:2013*IEEE Std 1620:2008
Release Date
2013
Published By
Institute of Electrical and Electronics Engineers (IEEE)
Latest
IEC 62860:2013*IEEE Std 1620:2008
Scope
Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particu...

IEC 62860:2013*IEEE Std 1620:2008 history




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