T/CASAS 026-2023
Test method for minority carrier lifetime in silicon carbide—microwave photoconductive decay (English Version)

Standard No.

T/CASAS 026-2023

Language

Chinese, Available in English version

Release Date

2023

Published By

Group Standards of the People's Republic of China

Latest

T/CASAS 026-2023

Scope

This document describes a method for determining the minority carrier lifetime of silicon carbide using microwave photoconductivity. This document is applicable to the lifetime measurement and quality evaluation of silicon carbide wafers with minority carrier lifetimes of 20 ns to 200 μs.

T/CASAS 026-2023 history

• 2023 T/CASAS 026-2023 Test method for minority carrier lifetime in silicon carbide—microwave photoconductive decay