KS C IEC 60749-13-2020
Semiconductor devices — Mechanical and climatic test methods — Part 13: Salt atmosphere

Standard No.

KS C IEC 60749-13-2020

Release Date

2020

Published By

KR-KS

Latest

KS C IEC 60749-13-2020

KS C IEC 60749-13-2020 history

• 2020 KS C IEC 60749-13:2020 Semiconductor devices — Mechanical and climatic test methods — Part 13: Salt atmosphere
• 2002 KS C IEC 60749-13:2002 Semiconductor devices-Mechanical and climatic test methods-Part 13:Salt atmosphere