IEC 60749-41:2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
- Standard No.
- IEC 60749-41:2020
- Release Date
- 2020
- Published By
- International Electrotechnical Commission (IEC)
- Latest
- IEC 60749-41:2020
IEC 60749-41:2020 history
- 2020 IEC 60749-41:2020 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
