SJ/T 11765-2020
Transistor low-frequency noise parameter testing method (English Version)

Standard No.

SJ/T 11765-2020

Language

Chinese, Available in English version

Release Date

2020

Published By

工业和信息化部

Latest

SJ/T 11765-2020

SJ/T 11765-2020 history

• 2020 SJ/T 11765-2020 Transistor low-frequency noise parameter testing method