DIN 50447:1995
Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method
- Standard No.
- DIN 50447:1995
- Release Date
- 1995
- Published By
- German Institute for Standardization
- Status
- Latest
- DIN 50447:1995
DIN 50447:1995 history
- 1995 DIN 50447:1995 Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method
