SAE J1752/1-2021
Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

Standard No.
SAE J1752/1-2021
Release Date
2021
Published By
Society of Automotive Engineers (SAE)
Latest
SAE J1752/1-2021
Scope
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.

SAE J1752/1-2021 history

  • 2021 SAE J1752/1-2021 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions
  • 2016 SAE J1752/1-2016 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions
  • 2006 SAE J1752/1-2006 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits—Integrated Circuit EMC Measurement Procedures—General and Definitions
  • 1997 SAE J1752/1-1997 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits-Integrated Circuit Emc Measurement Procedures-General and Definition

SAE J1752/1-2021 -All Parts

SAE J1752-1-2021 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition SAE J1752-2-2016 Measurement of Radiated Emissions from Integrated Circuits-Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz SAE J1752-3-2017 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition SAE J1752/1-2021 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions SAE J1752/2-2016 Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz SAE J1752/3-2017 Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)


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