IEC 63229:2021
Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate

Standard No.

IEC 63229:2021

Release Date

2021

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 63229:2021

IEC 63229:2021 history

• 2021 IEC 63229:2021 Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate