This document specifies the terms and definitions, structural requirements, technical requirements, test methods, inspection rules, markings, packaging, transportation and storage, and precautions for the scanning electron microscope in-situ high-temperature mechanical testing device. This document is applicable to the production and inspection of in-situ high-temperature mechanical testing devices for scanning electron microscopes. Hereinafter referred to as the device.
T/QGCML 1940-2023 history
2023T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device