KS C IEC 60749-1-2006(2021)
Semiconductor devices－Mechanical and climatic test methods－Part 1：General

Standard No.

KS C IEC 60749-1-2006(2021)

Release Date

2006

Published By

Korean Agency for Technology and Standards (KATS)

Latest

KS C IEC 60749-1-2006(2021)

KS C IEC 60749-1-2006(2021) history

• 0000 KS C IEC 60749-1-2006(2021)
• 0000 KS C IEC 60749-1-2006(2016)
• 2006 KS C IEC 60749-1:2006 Semiconductor devices－Mechanical and climatic test methods－Part 1：General