DB61/T 512-2011
Inspection rules for monocrystalline silicon wafers for solar cells (English Version)

Standard No.

DB61/T 512-2011

Language

Chinese, Available in English version

Release Date

2011

Published By

Shaanxi Provincial Standard of the People's Republic of China

Latest

DB61/T 512-2011

Scope

This standard applies to the inspection of monocrystalline silicon wafers for solar cells (hereinafter referred to as ghost wafers)

DB61/T 512-2011 history

• 2011 DB61/T 512-2011 Inspection rules for monocrystalline silicon wafers for solar cells