UNE-EN IEC 60749-30:2020
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Endorsed by Asociación Española de Normalización in November of 2020.)

Standard No.

UNE-EN IEC 60749-30:2020

Release Date

2020

Published By

ES-UNE

Latest

UNE-EN IEC 60749-30:2020

UNE-EN IEC 60749-30:2020 history

• 2020 UNE-EN IEC 60749-30:2020 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Endorsed by Asociación Española de Normalización in November of 2020.)