NF C96-022-4*NF EN 60749-4:2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp Heat, steady state, highly accelerated stress test (HAST)

Standard No.

NF C96-022-4*NF EN 60749-4:2017

Release Date

2017

Published By

Association Francaise de Normalisation

Latest

NF C96-022-4*NF EN 60749-4:2017

NF C96-022-4*NF EN 60749-4:2017 history

• 2017 NF C96-022-4*NF EN 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp Heat, steady state, highly accelerated stress test (HAST)