BS IEC 62951-6:2019
Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films

Standard No.

BS IEC 62951-6:2019

Release Date

2019

Published By

British Standards Institution (BSI)

Latest

BS IEC 62951-6:2019

Scope

What is BS IEC 62951 ‑ 6 - Semiconductor devices about?    BS IEC 62951-6 is the sixth part of an International Standard used for Semiconductor devices.    BS IEC 62951-6 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.     Who is BS IEC 62951-6 - Semiconductor devices for?   BS IEC 62951-6 Semiconductor devices are beneficial for:   Semiconductor foundries BS IEC 62951-6:2019 history

• 2019 BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films