T/ZSA 47-2020
Reliability test methods for power semiconductor devices in electric vehicle applications (English Version)

Standard No.
T/ZSA 47-2020
Language
Chinese, Available in English version
Release Date
2020
Published By
Group Standards of the People's Republic of China
Latest
T/ZSA 47-2020
Scope
This document specifies the functional inspection requirements, reliability test requirements and test methods before the reliability test of power semiconductor devices for electric vehicles. This document also specifies special test requirements for automotive wide bandgap power semiconductor devices. This document applies to non-insulating power semiconductor devices and insulating power semiconductor modules, including but not limited to insulated gate bipolar transistors, metal oxide field effect transistors and diode devices and modules. This document provides guidelines for reliability type testing and reliability design and inspection of power semiconductor devices for electric vehicles.

T/ZSA 47-2020 history

  • 2020 T/ZSA 47-2020 Reliability test methods for power semiconductor devices in electric vehicle applications



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