EN IEC 60749-5:2024
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Standard No.

EN IEC 60749-5:2024

Release Date

2024

Published By

European Committee for Electrotechnical Standardization（CENELEC）

Latest

EN IEC 60749-5:2024

EN IEC 60749-5:2024 history

• 2024 EN IEC 60749-5:2024 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test