IEEE No 256-1963
IEEE Test Procedure for Semiconductor Diodes

Standard No.

IEEE No 256-1963

Release Date

1963

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Latest

IEEE No 256-1963

Scope

This Standard recommends and describes methods of measurement of the important electrical characteristics of semiconductor diodes, For the purpose of this Standard, a semiconductor diode is defined as: "A semiconductor device having two terminals and exhibiting a nonlinear voltage-current characteristic ; in more restricted usage, a semiconductor device which has the asymmetrical voltage-current c...

IEEE No 256-1963 history

• 1963 IEEE No 256-1963 IEEE Test Procedure for Semiconductor Diodes