T/IAWBS 004-2021
General Requirements and Test Methods for Reliability Test of Power Semiconductor Modules Used in Electric Vehicles (English Version)
- Standard No.
- T/IAWBS 004-2021
- Language
- Chinese, Available in English version
- Release Date
- 2021
- Published By
- Group Standards of the People's Republic of China
- Latest
- T/IAWBS 004-2021
- Scope
- This document specifies the functional inspection requirements, reliability test requirements and test methods before the reliability test of power semiconductor devices for electric vehicles. This document also gives special test requirements for automotive wide bandgap semiconductor devices, such as silicon carbide-based field effect transistor devices. This document applies to power semiconductor devices (discrete devices or modules), including but not limited to insulated gate bipolar transistors (IGBTs), metal oxide field effect transistors (MOSFETs), and diode devices. This document can provide guidance for reliability type testing and reliability design and inspection of power semiconductor devices for electric vehicles.
T/IAWBS 004-2021 history
- 2021 T/IAWBS 004-2021 General Requirements and Test Methods for Reliability Test of Power Semiconductor Modules Used in Electric Vehicles
