GB/T 35306-2017
Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry (English Version)
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GB/T 35306-2017
Standard No.
GB/T 35306-2017
Language
Chinese,
Available in English version
Release Date
2017
Published By
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
Status
Be replaced
2024-03
Replace By
GB/T 35306-2023
Latest
GB/T 35306-2023
GB/T 35306-2017 history
2023
GB/T 35306-2023
Determination of Carbon and Oxygen Content in Silicon Single Crystal Low Temperature Fourier Transform Infrared Spectroscopy
2017
GB/T 35306-2017
Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry
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