This document specifies the terms and definitions, basic parameters, technical requirements, test methods, inspection rules, signs, instructions for use, packaging, transportation and storage of semiconductor device intermittent working life test equipment (hereinafter referred to as life test equipment). This document is suitable for verifying the service life of semiconductor power devices such as diodes, transistors, SCRs, MOSFETs, IGBTs and other semiconductor power devices packaged in Si\GaN\SiC materials, and for testing equipment that performs accelerated failure analysis on intermittent working life.
T/ZZB Q063-2022 history
2022T/ZZB Q063-2022 Intermittent working life test equipment for semiconductor devices