DB52/T 1104-2016
Transient test method for junction-case thermal resistance of semiconductor devices (English Version)

Standard No.

DB52/T 1104-2016

Language

Chinese, Available in English version

Release Date

2016

Published By

Guizhou Provincial Standard of the People's Republic of China

Latest

DB52/T 1104-2016

DB52/T 1104-2016 history

• 2016 DB52/T 1104-2016 Transient test method for junction-case thermal resistance of semiconductor devices