DIN EN 62374:2008-02
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007

Standard No.

DIN EN 62374:2008-02

Release Date

2008

Published By

German Institute for Standardization

Latest

DIN EN 62374:2008-02

DIN EN 62374:2008-02 history

• 2008 DIN EN 62374:2008-02 Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007
• 2008 DIN EN 62374:2008 Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007