DIN EN IEC 60749-41:2023-03
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020
- Standard No.
- DIN EN IEC 60749-41:2023-03
- Release Date
- 2023
- Published By
- German Institute for Standardization
- Latest
- DIN EN IEC 60749-41:2023-03
DIN EN IEC 60749-41:2023-03 history
- 2023 DIN EN IEC 60749-41:2023-03 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020
