DIN SPEC 52407:2015-03
Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Standard No.
DIN SPEC 52407:2015-03
Release Date
2015
Published By
German Institute for Standardization
Latest
DIN SPEC 52407:2015-03

DIN SPEC 52407:2015-03 history

  • 2015 DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)



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