UNE-EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength

Standard No.

UNE-EN 60749-19:2003

Release Date

2003

Published By

AENOR

Status

Be replaced 2011-01

Replace By

UNE-EN 60749-19:2003/A1:2011

Latest

UNE-EN 60749-19:2003/A1:2011

UNE-EN 60749-19:2003 history

• 2011 UNE-EN 60749-19:2003/A1:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
• 2003 UNE-EN 60749-19:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength