YB/T 172-2020
Quantitative phase analysis of silica bricks by X-ray diffraction method (English Version)

Standard No.

YB/T 172-2020

Language

Chinese, Available in English version

Release Date

2020

Published By

工业和信息化部

Latest

YB/T 172-2020

Replace

YB/T 172-2000

YB/T 172-2020 history

• 2020 YB/T 172-2020 Quantitative phase analysis of silica bricks by X-ray diffraction method
• 2000 YB/T 172-2000 Phase quantitative analysis of silica bricks.X-ray diffraction method