IEC 62951-6:2019
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

Standard No.

IEC 62951-6:2019

Release Date

2019

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 62951-6:2019

Scope

This part of IEC 62951 specifies terms@ as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe@ 4-point probe and Montgomery method@ which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

IEC 62951-6:2019 history

• 2019 IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films