BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing

Standard No.

BS EN IEC 60749-30:2020

Release Date

2020

Published By

British Standards Institution (BSI)

Latest

BS EN IEC 60749-30:2020

Scope

What is BS EN IEC 60749 ‑ 30 about?    BS EN IEC 60749 ‑ 30 is the 30th part of the multimerise Internation standard on semiconductor devices.   BS EN IEC 60749 ‑ 30 establishes a standard procedure for determining the preconditioning   of non-hermetic surface mount devices (SMDs) prior to reliability testing.   

BS EN IEC 60749-30:2020 history

• 2020 BS EN IEC 60749-30:2020 Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing