This standard specifies the gas chromatography method for the determination of phosphine content in hydrogen for polycrystalline silicon. This standard is applicable to the determination of phosphine content in hydrogen used for polysilicon. The measurement range is 0.02×10-9 ~ 1×10-5 (v/v).
T/CNIA 0060-2020 history
2020T/CNIA 0060-2020 Determination of phosphine content in hydrogen for polysilicon by gas chromatography