UNE-EN IEC 60749-41:2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Española de Normalización in October of 2020.)
- Standard No.
- UNE-EN IEC 60749-41:2020
- Release Date
- 2020
- Published By
- ES-UNE
- Latest
- UNE-EN IEC 60749-41:2020
UNE-EN IEC 60749-41:2020 history
- 2020 UNE-EN IEC 60749-41:2020 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Española de Normalización in October of 2020.)
