IEEE C37.26-2003
Guide for Methods of Power Factor Measurement for Low-Voltage Inductive Test Circuits

Standard No.

IEEE C37.26-2003

Release Date

2003

Published By

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

Status

Be replaced 2014-10

Replace By

IEEE C37.26-2014

Latest

IEEE C37.26-2014

Scope

This guide describes three methods used in the measurement of the power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however@ the values in the tables are specifically for 60 Hz test circuits. These methods are:1) Ratio method2) DC decrement method3) Phase relationship methodTable 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits@ the methods discussed are also usable at higher voltages.

IEEE C37.26-2003 history

• 2014 IEEE C37.26-2014 Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits
• 2003 IEEE C37.26-2003 Guide for Methods of Power Factor Measurement for Low-Voltage Inductive Test Circuits
• 1970 IEEE C37.26-1972 IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits
• 1971 IEEE C37.26-1971 Standard Guide for Methods of Power-Factor Measurement for Low- Voltage Inductive Test Circuits