1 Scope
Resistance measurements are typically compromised by a variety of phenomena, for example
serial resistance in the measurement path, self-heating or non-ohmic properties. Whether
the effect of such phenomena on a resistance measurement is acceptable or not depends
on the magnitude of each effect in comparison to the resistance and to the required
accuracy. Hence, the risk of erroneous resistance measurements increases with decreasing
resistance and with a tightening of the permissible tolerance.
This document specifies methods of measurement and associated test conditions that
eliminate or reduce the influence of adverse phenomena in order to improve the attainable
accuracy of low-resistance measurements.
The methods described in this document are applicable for the individual measurements
of the resistance of individual resistors, and also for resistance measurements as
part of a test sequence. They are applied if prescribed by a relevant component specification,
or if agreed between a customer and a manufacturer.