DIN 50455-2:1999-11
Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists
- Standard No.
- DIN 50455-2:1999-11
- Release Date
- 1999
- Published By
- German Institute for Standardization
- Latest
- DIN 50455-2:1999-11
DIN 50455-2:1999-11 history
- 1999 DIN 50455-2:1999-11 Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists
- 1999 DIN 50455-2:1999 Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists
