This report describes a method of semiconductor resistance measurement using controlled energy levels and a digital processing oscilloscope to acquire and process test data.
SAE AIR1921-1994 history
1994SAE AIR1921-1994 SPARK IGNITER SEMICONDUCTOR RESISTANCE MEASUREMENT USING CONTROLLED ENERGY LEVELS
1985SAE AIR1921-1985 Spark Igniter Semiconductor Resistance Measurement Using Controlled Energy Levels