IEEE Std 660-1986
IEEE Standard for Semiconductor Memory Test Pattern Language
- Standard No.
- IEEE Std 660-1986
- Release Date
- 1986
- Published By
- Institute of Electrical and Electronics Engineers (IEEE)
- Latest
- IEEE Std 660-1986
- Scope
- The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify the functional testing of memory devices. The language is intended to be used as a general descriptive language rather than one for programming a tester. As a result, the grammar and syntax are defined in...
IEEE Std 660-1986 history
- 1986 IEEE Std 660-1986 IEEE Standard for Semiconductor Memory Test Pattern Language
